ECE 5620 - Digital System Testing

Institution:

Weber State University

Subject:

Description:

Fundamentals of testing digital circuits and memory devices, including fault modeling, test pattern generation, and test coverage. Introduction to design for test and built-in self-test. Laboratory activities include performing bench and automated testing of digital and memory chips, and generating test patterns for fault detection.

Credits:

3.00

Credit Hours:

Prerequisites:

ECE 3610

Corequisites:

Exclusions:

Level:

Instructional Type:

Lecture

Notes:

Additional Information:

Historical Version(s):

Institution Website:

www.weber.edu

Phone Number:

(801) 626-6000

Regional Accreditation:

Northwest Commission on Colleges and Universities

Calendar System:

Semester

General Education

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