3.00 Credits
This course consists of application process control and problem solving techniques including statistical process control (SPC), measurement systems analysis, and process capability analysis. Students will apply cause-and-effect diagrams, check sheets, sampling, line and bar charts, Pareto charts, scatter diagrams, variation, probability plots, x-R charts, gate repeatability and reproducibility (gage R & R) on course projects. Curriculum will include practical application exercises.
Prerequisite:
MATH 1010 and MATH 1040 and MATH 105 and MATH 1160 and MATH 141 and MATH 241 and MFET 2410 and MFET 355