3.00 Credits
Study of failure and fault models in digital circuits, stuck-at-faults, transition faults, transistor faults, combinational/sequential circuit ATPG, FSM testing, design fault test, LFSR and BIST, equivalence checking, BDDs, BMDs, canonical representations of Boolean functions. Prerequisites: "C-" or better in (CS 3700 OR ECE 3700) AND Full Major status in (Electrical Engineering OR Computer Engineering OR Computer Science).